Ultrafast tool to inspect and compare layouts.
Layout VIEWER is an ideal, ultrafast tool to inspect and compare layouts. On the input side, all major layout (GDSII, OASIS, CIF, DXF) and e-beam machine formats are supported. Multiple layout files can be loaded in parallel to draw them overlaid. The user has a multitude of viewing options and capabilities.
- Extensive color management (user defined palette, transparency and overlay colors , and mapping of colors to layers/datatypes, doses, cells, layouts)
- Metrology support (measure, pick, various snapping options such as snap to edge, snap to corner, snap orthogonal)
- Hierarchy support–view of the hierarchy tree, selection of cells / layers to be displayed, drawing of features down to a user specified hierarchy depth)
- Script generation for automation of metrology equipment and visualization of metrology results added into the layout